BREAKDOWN OF COHERENCE IN RESONANT TUNNELING THROUGH DOUBLE-BARRIER HETEROSTRUCTURES

被引：17

作者：

GOLDMAN, VJ ^{[1
]}

TSUI, DC ^{[1
]}

CUNNINGHAM, JE ^{[1
]}

机构：

[1] AT&T BELL LABS,HOLMDEL,NJ 07733

来源：

SOLID-STATE ELECTRONICS | 1988年 / 31卷 / 3-4期

关键词：

D O I：

10.1016/0038-1101(88)90376-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

10

引用

收藏

页码：731 / 734

页数：4

相关论文

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