SOME INVESTIGATIONS ON THE INFLUENCE OF DEFECTS-GRAIN BOUNDARIES ON PHOTO-VOLTAIC MECHANISMS IN POLYCRYSTALLINE SILICON FILMS

被引:6
作者
SOPORI, BL
BAGHDADI, A
机构
来源
SOLAR CELLS | 1980年 / 1卷 / 03期
关键词
D O I
10.1016/0379-6787(80)90070-8
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
引用
收藏
页码:237 / 250
页数:14
相关论文
共 4 条
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BAGHDADI A, 1978, 13TH PHOT SPEC C WAS
[3]   MEASUREMENT OF MINORITY-CARRIER LIFETIME PROFILES IN SILICON [J].
SCHWAB, G ;
BERNT, H ;
REICHL, H .
SOLID-STATE ELECTRONICS, 1977, 20 (02) :91-&
[4]   EFFECTS OF OPTICAL BEAM SIZE ON DIFFUSION LENGTH MEASURED BY THE SURFACE PHOTO-VOLTAGE METHOD [J].
SOPORI, BL ;
GURTLER, RW ;
LESK, IA .
SOLID-STATE ELECTRONICS, 1980, 23 (02) :139-142