APPLICATION OF ASYMMETRIC REFLECTIONS TO THE X-RAY STUDY OF STRUCTURAL DEFORMATION OF SURFACES

被引：3

作者：

BALESTRINO, G

LAGOMARSINO, S

MASTROGIACOMO, L

SCARINCI, F

TUCCIARONE, A

机构：

来源：

THIN SOLID FILMS | 1981年 / 78卷 / 04期

关键词：

D O I：

10.1016/0040-6090(81)90035-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：327 / 334

页数：8

共 10 条

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[2]

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[3]

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[4] X-RAY CHARACTERIZATION OF THE ANISOTROPY PROPERTIES OF THIN-FILMS [J].

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SCARINCI, F ;

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MASTROGIACOMO, L .

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[5]

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[6]

BALESTRINO G, 1978, 11TH INT C CRYST WAR

[7]

Guinier A, 1952, XRAY CRYSTALLOGRAPHI

[8]

KLUG HP, 1954, XRAY DIFFRACTION PRO

[9]

Zachariasen W. H., 1945, THEORY XRAY DIFFRACT

[10] STRESSES IN EPITAXIALLY GROWN SINGLE-CRYSTAL FILMS - YIG ON YAG [J].

ZEYFANG, R .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (09) :3718-+

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