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HIGH-ACCURACY WIDE-RANGE MEASUREMENT METHOD FOR DETERMINATION OF COMPLEX PERMITTIVITY IN REENTRANT CAVITY .A. THEORETICAL-ANALYSIS OF THE METHOD

被引：27
作者：
KACZKOWSKI, A
MILEWSKI, A
机构：
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1980年 / 28卷 / 03期
关键词：
D O I：
10.1109/TMTT.1980.1130045
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：225 / 228
页数：4
相关论文
共 6 条
[1]   CAVITY PERTURBATION TECHNIQUES FOR MEASUREMENT OF MICROWAVE CONDUCTIVITY AND DIELECTRIC-CONSTANT OF A BULK SEMICONDUCTOR MATERIAL [J].
ELDUMIATI, II ;
HADDAD, GI .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1972, MT20 (02) :126-+
[2]   MICROWAVE PROPERTIES OF N-TYPE INSB IN A MAGNETIC-FIELD BETWEEN 4 AND 300 DEGREES K [J].
ELDUMIATI, II ;
HADDAD, GI .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (01) :395-405
[3]  
KACZKOWSKI A, 1980, HIGH ACCURACY WIDE R, V28, P228
[4]  
KARPOVA OV, 1959, FIZ TWERD TELA, V1, P246
[5]  
Milewski A., 1977, Electron Technology, V10, P71
[6]  
PARRY JVL, 1951, P I ELECTR ENG, V98, P303, DOI 10.1049/pi-3.1951.0062
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