DETERMINATION OF LARGE CRYSTAL STRUCTURES BY COMBINED X-RAY DIFFRACTION AND ELECTRON MICROSCOPY

被引:17
作者
KOHN, JA
ECKART, DW
COOK, CF
机构
关键词
D O I
10.1016/0025-5408(67)90043-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:55 / +
页数:1
相关论文
共 12 条
  • [1] Brawn R.B., 1957, Philips Res Rep., V12, P491
  • [2] COOK CF, 1966, J6 AM CRYST ASS PAP
  • [3] SILICON CARBIDE OF 594 LAYERS
    HONJO, G
    MIYAKE, S
    TOMITA, T
    [J]. ACTA CRYSTALLOGRAPHICA, 1950, 3 (05): : 396 - &
  • [4] KOHN J, 1966, Z KRIST, V121
  • [5] Kohn J.A., 1964, Z KRISTALLOGR, V119, P454, DOI DOI 10.1524/ZKRI.1964.119.5-6.454/MACHINEREADABLECITATION/RIS
  • [6] NEW MN-SUBSTITUTED HEXAGONAL FERRITES
    KOHN, JA
    ECKERT, DW
    [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (3P2) : 1171 - &
  • [7] KOHN JA, 1965, AM MINERAL, V50, P1371
  • [8] NEW HEXAGONAL FERRITE ESTABLISHING 2ND STRUCTURAL SERIES
    KOHN, JA
    ECKART, DW
    [J]. JOURNAL OF APPLIED PHYSICS, 1964, 35 (3P2) : 965 - &
  • [9] KOHN JA, 1966, 566 INT UN CRYST PAP
  • [10] KUO CL, 1964, SCI SINICA, V13, P1773