AN APPLICABLE FAMILY OF DATA FLOW TESTING CRITERIA

被引：238

作者：

FRANKL, PG ^{[1
]}

WEYUKER, EJ ^{[1
]}

机构：

[1] NYU, COURANT INST MATH SCI, DEPT COMP SCI, NEW YORK, NY 10012 USA

来源：

IEEE TRANSACTIONS ON SOFTWARE ENGINEERING | 1988年 / 14卷 / 10期

关键词：

Manuscript received September 15; 1986. This research was supported in part by the National Science Foundation under Grant DCR8501614 and by the Ofice of Naval Research under Contract N00014-85-K-0414; P. G. Frank1 is with the Department of Electrical Engineering and Com- puter Science; Polytechnic University; Brooklyn; NY 11201. E. J. Weyuker is with the Department of Computer Science; Courant Institute of Mathematical Sciences; New York University; New York; NY 10012. IEEE Log Number 8823071;

D O I：

10.1109/32.6194

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

引用

页码：1483 / 1498

页数：16

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