SOME CALCULATIONS OF TEMPERATURE PROFILES IN THIN-FILMS WITH LASER-HEATING

[1] THE OPTICAL COMPUTER [J]. SCIENTIFIC AMERICAN, 1983, 248 (02) : 85 - &

[2] CRITICAL INTERPIXEL SEPARATION IN NONLINEAR INTERFERENCE FILTERS [J]. OPTICS LETTERS, 1986, 11 (10) : 689 - 691

[3] OPTICAL BISTABILITY AND RELATED DEVICES [J]. REPORTS ON PROGRESS IN PHYSICS, 1982, 45 (08) : 815 - 885

[4] TEMPERATURE DISTRIBUTIONS PRODUCED IN A 2-LAYER STRUCTURE BY A SCANNING CW LASER OR ELECTRON-BEAM [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : 4357 - 4363

[5] MODELING OF CW LASER ANNEALING OF MULTILAYER STRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (11) : 7545 - 7550

[6] CARSLAW HS, 1959, CONDUCTION HEAT SOLI

[7] GIBBS HM, 1986, SPRINGER P PHYS, V8

[8] Gibbs HM, 1985, OPTICAL BISTABILITY

[9] Karpushko F. V., 1978, Zhurnal Prikladnoi Spektroskopii, V29, P820

[10] TEMPERATURE RISE INDUCED BY A LASER-BEAM .2. NON-LINEAR CASE [J]. APPLIED PHYSICS LETTERS, 1978, 33 (08) : 786 - 788

[1] THE OPTICAL COMPUTER [J]. SCIENTIFIC AMERICAN, 1983, 248 (02) : 85 - &

[2] CRITICAL INTERPIXEL SEPARATION IN NONLINEAR INTERFERENCE FILTERS [J]. OPTICS LETTERS, 1986, 11 (10) : 689 - 691

[3] OPTICAL BISTABILITY AND RELATED DEVICES [J]. REPORTS ON PROGRESS IN PHYSICS, 1982, 45 (08) : 815 - 885

[4] TEMPERATURE DISTRIBUTIONS PRODUCED IN A 2-LAYER STRUCTURE BY A SCANNING CW LASER OR ELECTRON-BEAM [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (06) : 4357 - 4363

[5] MODELING OF CW LASER ANNEALING OF MULTILAYER STRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (11) : 7545 - 7550

[6] CARSLAW HS, 1959, CONDUCTION HEAT SOLI

[7] GIBBS HM, 1986, SPRINGER P PHYS, V8

[8] Gibbs HM, 1985, OPTICAL BISTABILITY

[9] Karpushko F. V., 1978, Zhurnal Prikladnoi Spektroskopii, V29, P820

[10] TEMPERATURE RISE INDUCED BY A LASER-BEAM .2. NON-LINEAR CASE [J]. APPLIED PHYSICS LETTERS, 1978, 33 (08) : 786 - 788