SURFACE MODIFICATION IN THE NANOMETER RANGE BY THE SCANNING TUNNELING MICROSCOPE

被引：56

作者：

STAUFER, U ^{[1
]}

WIESENDANGER, R ^{[1
]}

ENG, L ^{[1
]}

ROSENTHALER, L ^{[1
]}

HIDBER, HR ^{[1
]}

GUNTHERODT, HJ ^{[1
]}

GARCIA, N ^{[1
]}

机构：

[1] UNIV AUTONOMA MADRID,DEPT FIS FUNDAMENTAL,E-28049 MADRID,SPAIN

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575377

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：537 / 539

页数：3

共 7 条

[1] HEAT TREATING AND MELTING MATERIAL WITH A SCANNING LASER OR ELECTRON-BEAM
CLINE, HE
ANTHONY, TR
[J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (09) : 3895 - 3900
[2] ENERGY-DISSIPATION PROCESSES IN SCANNING TUNNELING MICROSCOPY
FLORES, F
ECHENIQUE, PM
RITCHIE, RH
[J]. PHYSICAL REVIEW B, 1986, 34 (04) : 2899 - 2902
[3] TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT STUDIED USING SCANNING TUNNELING MICROSCOPY
GIMZEWSKI, JK
MOLLER, R
[J]. PHYSICAL REVIEW B, 1987, 36 (02): : 1284 - 1287
[4] TEMPERATURE PROFILES IN SOLID TARGETS IRRADIATED WITH FINELY FOCUSED BEAMS
IRANMANESH, AA
PEASE, RFW
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (01): : 91 - 99
[5] Krempasky J., 1979, Acta Physica Slovaca, V29, P56
[6] TSCHUMI A, 1984, THESIS U BASEL
[7] APPLICATION OF SCANNING TUNNELING MICROSCOPY TO DISORDERED-SYSTEMS
WIESENDANGER, R
RINGGER, M
ROSENTHALER, L
HIDBER, HR
OELHAFEN, P
RUDIN, H
GUNTHERODT, HJ
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 46 - 54