OPTICAL AND ELECTRICAL-PROPERTIES OF SNOX THIN-FILMS MADE BY REACTIVE RF MAGNETRON SPUTTERING

被引:15
作者
STJERNA, B [1 ]
GRANQVIST, CG [1 ]
机构
[1] GOTHENBURG UNIV, S-41296 GOTHENBURG, SWEDEN
关键词
D O I
10.1016/0040-6090(90)90222-Y
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
SnO(x) films were made by reactive r.f. magnetron sputtering of tin in Ar-O2 onto unheated glass. At a well-defined O2-to-Ar gas flow ratio, one could obtain an electrical resistivity of about 10(-2)-OMEGA-cm, a luminous transmittance of about 75% and a deposition rate of about 3 nms-1. The optical and electrical properties could be quantitatively understood from a theoretical model for wide-band-gap semiconductors, heavily n-type doped by doubly ionized oxygen vacancies, that accounted for ionized impurity scattering of the free electrons.
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页码:704 / 711
页数:8
相关论文
共 19 条
[1]  
Born M., 1983, PRINCIPLES OPTICS
[2]   ELECTRODYNAMICS OF A SEMICLASSICAL FREE-ELECTRON GAS [J].
CALKIN, MG ;
NICHOLSON, PJ .
REVIEWS OF MODERN PHYSICS, 1967, 39 (02) :361-+
[3]   INFRARED OPTICAL-PROPERTIES OF SILICON OXYNITRIDE FILMS - EXPERIMENTAL-DATA AND THEORETICAL INTERPRETATION [J].
ERIKSSON, TS ;
GRANQVIST, CG .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (06) :2081-2091
[4]   ELECTRICAL PROPERTIES OF HIGH-QUALITY STANNIC OXIDE CRYSTALS [J].
FONSTAD, CG ;
REDIKER, RH .
JOURNAL OF APPLIED PHYSICS, 1971, 42 (07) :2911-&
[5]   CARRIER SCATTERING AND TRANSPORT IN SEMICONDUCTORS TREATED BY THE ENERGY-LOSS METHOD [J].
GERLACH, E .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1986, 19 (24) :4585-4603
[6]  
Granqvist C.G., 1989, SPECTRALLY SELECTIVE
[7]   THE OPTICAL, ELECTRICAL AND STRUCTURAL-PROPERTIES OF FLUORINE-DOPED, PYROLYTICALLY SPRAYED TINDIOXIDE COATINGS [J].
HAITJEMA, H ;
ELICH, JJP ;
HOOGENDOORN, CJ .
SOLAR ENERGY MATERIALS, 1989, 18 (05) :283-297
[8]   EVAPORATED SN-DOPED IN2O3 FILMS - BASIC OPTICAL-PROPERTIES AND APPLICATIONS TO ENERGY-EFFICIENT WINDOWS [J].
HAMBERG, I ;
GRANQVIST, CG .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (11) :R123-R159
[9]  
Hubbard J., 1957, P ROY SOC A-MATH PHY, V243, P336, DOI [10.1098/rspa.1957.0106, DOI 10.1098/RSPA.1957.0106]
[10]  
JARZEBSKI ZM, 1976, J ELECTROCHEM SOC, V123, pC199, DOI [10.1149/1.2133090, 10.1149/1.2132647]