INFRARED OPTICAL-PROPERTIES OF SILICON OXYNITRIDE FILMS - EXPERIMENTAL-DATA AND THEORETICAL INTERPRETATION

被引:145
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ERIKSSON, TS
GRANQVIST, CG
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10.1063/1.337212
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O59 [应用物理学];
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页码:2081 / 2091
页数:11
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[1]   OPTICAL-PROPERTIES OF THIN-FILMS [J].
ASPNES, DE .
THIN SOLID FILMS, 1982, 89 (03) :249-262
[2]   DIELECTRIC FUNCTION OF SI-SIO2 AND SI-SI3N4 MIXTURES [J].
ASPNES, DE ;
THEETEN, JB .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (07) :4928-4935
[3]   SILICON OXYNITRIDE - A MATERIAL FOR GRIN OPTICS [J].
BAAK, T .
APPLIED OPTICS, 1982, 21 (06) :1069-1072
[4]  
Born M, 1980, PRINCIPLES OPTICS
[5]   LOW-TEMPERATURE DEPOSITION OF SILICON-NITRIDE BY REACTIVE ION-BEAM SPUTTERING [J].
BOUCHIER, D ;
GAUTHERIN, G ;
SCHWEBEL, C ;
BOSSEBOEUF, A ;
AGIUS, B ;
RIGO, S .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (03) :638-644
[6]   SOLAR ABSORPTIVITY AND THERMAL EMISSIVITY OF ALUMINUM COATED WITH SILICON OXIDE FILMS PREPARED BY EVAPORATION OF SILICON MONOXIDE [J].
BRADFORD, AP ;
HASS, G ;
HEANEY, JB ;
TRIOLO, JJ .
APPLIED OPTICS, 1970, 9 (02) :339-&
[7]   PROPERTIES OF SIXOYNZ FILMS ON SI [J].
BROWN, DM ;
GRAY, PV ;
HEUMANN, FK ;
PHILIPP, HR ;
TAFT, EA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (03) :311-&
[9]   ANALYSIS OF EVAPORATED SILICON OXIDE FILMS BY MEANS OF (D,P) NUCLEAR REACTIONS AND INFRARED SPECTROPHOTOMETRY [J].
CACHARD, A ;
ROGER, JA ;
PIVOT, J ;
DUPUY, CHS .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 5 (03) :637-&
[10]   LONG WAVELENGTH OPTICAL PHONONS IN MIXED CRYSTALS [J].
CHANG, IF ;
MITRA, SS .
ADVANCES IN PHYSICS, 1971, 20 (85) :359-+