A NEW ANALYTICAL MODEL FOR THE GAAS-MESFET IN THE SATURATION REGION

被引:10
作者
POUVIL, P
GAUTIER, JL
PASQUET, D
机构
[1] ENSEA, Cergy, Fr
关键词
D O I
10.1109/16.2540
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
11
引用
收藏
页码:1215 / 1222
页数:8
相关论文
共 11 条
[1]  
AWANO Y, 1983, ELECTON LETT, V19, P19
[2]   SATURATION MECHANISM IN 1-MUM GATE GAAS-FET WITH CHANNEL-SUBSTRATE INTERFACIAL BARRIER [J].
BONJOUR, P ;
CASTAGNE, R ;
PONE, JF ;
COURAT, JP ;
BERT, G ;
NUZILLAT, G ;
PELTIER, M .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (06) :1019-1024
[3]  
CAPPY A, 1981, THESIS LILLE
[4]   SEMI-EMPIRICAL EXPRESSION FOR DIRECT TRANSCONDUCTANCE AND EQUIVALENT SATURATED VELOCITY IN SHORT-GATE-LENGTH MESFETS [J].
GRAFFEUIL, J ;
ROSSEL, P .
IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION, 1982, 129 (05) :185-188
[5]  
GRAFFEUIL J, 1977, THESIS TOULOUSE FRAN
[6]   GENERAL THEORY FOR PINCHED OPERATION OF JUNCTION-GATE FET [J].
GREBENE, AB ;
GHANDHI, SK .
SOLID-STATE ELECTRONICS, 1969, 12 (07) :573-+
[7]   2-DIMENSIONAL PARTICLE MODELS IN SEMICONDUCTOR-DEVICE ANALYSIS [J].
HOCKNEY, RW ;
WARRINER, RA ;
REISER, M .
ELECTRONICS LETTERS, 1974, 10 (23) :484-486
[8]  
POUVIL P, 1977, THESIS ORSAY
[9]  
SHOCKLEY W, 1952, P IRE, V40, P1305
[10]  
SONE JI, 1978, IEEE T ELECTRON DEV, V25, P329