共 5 条
- [4] Classification of defective analog integrated circuits using artificial neural networks [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2004, 20 (01): : 25 - 37
- [5] A tutorial introduction to research on analog and mixed-signal circuit testing. Milor L S. IEEE Transactions on Circuits and Systems Ⅱ: Analog and Digital Signal Processing . 1998