中子衍射残余应力无损测量技术及应用

被引：11

作者：

李峻宏

高建波

李际周

刘蕴韬

陈东风

机构：

[1] 中国原子能科学研究院核物理研究所中子散射实验室

来源：

中国材料进展 | 2009年 / 28卷 / 12期

关键词：

中子衍射; 残余应力; 残余应变;

D O I：

暂无

中图分类号：

O571.56 [中子衍射及其应用];

学科分类号：

0827 ; 082701 ;

摘要：

中子衍射作为一门实验技术,在描述材料内部残余应力方面有巨大的潜力,是允许工程师或材料科学家进行三维、无损、深度地获取材料内部残余应力分布状态的少数技术之一。回顾了中子衍射测量残余应力的发展历史,概述了中子衍射残余应力分析方法的基本原理与特点,并简单介绍了其在材料科学和工程应用领域的应用情况。最后根据国际国内中子源及中子谱仪的发展趋势,展望了此技术的应用领域与未来前景。

引用

页码：10 / 14+25 +25

页数：6

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