P03, the microfocus and nanofocus X-ray scattering (MiNaXS) beamline of the PETRA III storage ring: the microfocus endstation

被引：292

作者：

Buffet, Adeline ^{[1
]}

Rothkirch, Andre ^{[1
]}

Doehrmann, Ralph ^{[1
]}

Koerstgens, Volker ^{[2
]}

Abul Kashem, Mottakin M. ^{[1
]}

Perlich, Jan ^{[1
]}

Herzog, Gerd ^{[1
]}

Schwartzkopf, Matthias ^{[1
]}

Gehrke, Rainer ^{[1
]}

Mueller-Buschbaum, Peter ^{[2
]}

Roth, Stephan V. ^{[1
]}

机构：

[1] DESY, D-22603 Hamburg, Germany

[2] Tech Univ Munich, Dept Phys, Lehrstuhl Funktionelle Mat, D-85748 Garching, Germany

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2012年 / 19卷

关键词：

X-ray scattering; microfocus; kinetic studies; nanocomposites; INCIDENCE SMALL-ANGLE; FILMS; MICROFLUIDICS;

D O I：

10.1107/S0909049512016895

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The P03 beamline, also called the microfocus and nanofocus X-ray scattering (MiNaXS) beamline, exploits the excellent photon beam properties of the low-emittance source PETRA III to provide a microfocused/nanofocused beam with ultra-high intensity for time-resolved X-ray scattering experiments. The beamline has been designed to perform X-ray scattering in both transmission and reflection geometries. The microfocus endstation started user operation in May 2011. An overview of the beamline status and of some representative results highlighting the performance of the microfocus endstation at MiNaXS are given.

引用

页码：647 / 653

页数：7

共 36 条

[1] X-ray microfocussing combined with microfluidics for on-chip X-ray scattering measurements [J].

Barrett, R ;

Faucon, M ;

Lopez, J ;

Cristobal, G ;

Destremaut, F ;

Dodge, A ;

Guillot, P ;

Laval, P ;

Masselon, C ;

Salmon, JB .

LAB ON A CHIP, 2006, 6 (04) :494-499

[2]

Barthelmess M., 2008, EPAC 2008 CONTRIBUTI, P2320

[3] Flow in confined geometry introduced by dewetting of ultrathin polystyrene films [J].

Bauer, E. ;

Maurer, E. ;

Mehaddene, T. ;

Roth, S. V. ;

Mueller-Buschbaum, P. .

MACROMOLECULES, 2006, 39 (15) :5087-5094

[4] Time-Resolved Ultrathin Cobalt Film Growth on a Colloidal Polymer Template [J].

Buffet, Adeline ;

Abul Kashem, Mottakin M. ;

Schlage, Kai ;

Couet, Sebastien ;

Rohlsberger, Ralph ;

Rothkirch, Andre ;

Herzog, Gerd ;

Metwalli, Ezzeldin ;

Meier, Robert ;

Kaune, Gunar ;

Rawolle, Monica ;

Muller-Buschbaum, Peter ;

Gehrke, Rainer ;

Roth, Stephan V. .

LANGMUIR, 2011, 27 (01) :343-346

[5] X-ray absolute intensity measurement at HASYLAB ultrasmall angle x-ray scattering beamline BW4 [J].

Endres, A ;

Lode, U ;

vonKrosigk, G ;

Bark, M ;

Cunis, S ;

Gehrke, R ;

Wilke, W .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (11) :4009-4013

[6] Metal-Polymer Nanocomposites for Functional Applications [J].

Faupel, Franz ;

Zaporojtchenko, Vladimir ;

Strunskus, Thomas ;

Elbahri, Mady .

ADVANCED ENGINEERING MATERIALS, 2010, 12 (12) :1177-1190

[7]

Franz H., 2006, Synchrotron Radiation News, V19, P25

[8] A SAXS/WAXS/GISAXS Beamline with Multilayer Monochromator [J].

Hexemer, Alexander ;

Bras, Wim ;

Glossinger, James ;

Schaible, Eric ;

Gann, Eliot ;

Kirian, Rick ;

MacDowell, Alastair ;

Church, Matthew ;

Rude, Bruce ;

Padmore, Howard .

XIV INTERNATIONAL CONFERENCE ON SMALL-ANGLE SCATTERING (SAS09), 2010, 247

[9] NONSPECULAR X-RAY REFLECTION FROM ROUGH MULTILAYERS [J].

HOLY, V ;

BAUMBACH, T .

PHYSICAL REVIEW B, 1994, 49 (15) :10668-10676

[10]

Horbach J., 2010, DIAMOND LIGHT SOURCE, pe35

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