Resolution of coherent and incoherent imaging systems reconsidered - Classical criteria and a statistical alternative

被引:54
作者
Van Aert, S
Van Dyck, D
den Dekker, AJ
机构
[1] Univ Antwerp, Dept Phys, B-2020 Antwerp, Belgium
[2] Delft Univ Technol, Delft Ctr Syst & Control, NL-2628 CD Delft, Netherlands
关键词
D O I
10.1364/OE.14.003830
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The resolution of coherent and incoherent imaging systems is usually evaluated in terms of classical resolution criteria, such as Rayleigh's. Based on these criteria, incoherent imaging is generally concluded to be `better' than coherent imaging. However, this paper reveals some misconceptions in the application of the classical criteria, which may lead to wrong conclusions. Furthermore, it is shown that classical resolution criteria are no longer appropriate if images are interpreted quantitatively instead of qualitatively. Then one needs an alternative criterion to compare coherent and incoherent imaging systems objectively. Such a criterion, which relates resolution to statistical measurement precision, is proposed in this paper. It is applied in the field of electron microscopy, where the question whether coherent high resolution transmission electron microscopy (HRTEM) or incoherent annular dark field scanning transmission electron microscopy (ADF STEM) is preferable has been an issue of considerable debate. (c) 2006 Optical Society of America.
引用
收藏
页码:3830 / 3839
页数:10
相关论文
共 17 条
[1]   Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework [J].
den Dekker, AJ ;
Van Aert, S ;
van den Bos, A ;
Van Dyck, D .
ULTRAMICROSCOPY, 2005, 104 (02) :83-106
[2]   Does a monochromator improve the precision in quantitative HRTEM? [J].
den Dekker, AJ ;
Van Aert, S ;
Van Dyck, D ;
van den Bosa, A ;
Geuens, P .
ULTRAMICROSCOPY, 2001, 89 (04) :275-290
[3]   Resolution: A survey [J].
denDekker, AJ ;
vandenBos, A .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1997, 14 (03) :547-557
[4]  
Goodman J. W., 1968, INTRO FOURIER OPTICS, P129
[5]   Accurate structure determination from image reconstruction in ADF STEM [J].
Nellist, PD ;
Pennycook, SJ .
JOURNAL OF MICROSCOPY-OXFORD, 1998, 190 :159-170
[6]  
Pennycook SJ, 2000, MICROSC MICROANAL, V6, P343
[7]  
PENNYCOOK SJ, 2001, SPRINGER SERIES SURF, V38, P81
[8]  
Rayleigh L., 1903, SCI PAPERS LORD RAYL, V4, P235
[9]  
Rayleigh L., 1902, SCI PAPERS LORD RAYL, V3, P47
[10]  
RONCHI V, 1961, J OPT SOC AM, V51, P458