Buckling test under axial compression for multiwall carbon nanotubes

被引：8

作者：

Nishio, M

Akita, S

Nakayama, Y

机构：

[1] Osaka Prefecture Univ, Dept Phys & Elect, Sakai, Osaka 5998531, Japan

[2] Osaka Prefecture Univ, Dept Phys & Elect, Sakai, Osaka, Japan

[3] Osaka Univ, Grad Sch Engn, Handai Frontier Res Ctr, Suita, Osaka 5650871, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2005年 / 44卷 / 33-36期

关键词：

carbon nanotubes; nano-mechanics; critical bucking force; Young's modulus; van-der-Waals interaction; nano-manipulation;

D O I：

10.1143/JJAP.44.L1097

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have investigated buckling phenomena under axial compression for multiwall carbon nanotubes with the same outer diameter with different wall thicknesses obtained by the extraction of inner shells. According to the Euler's buckling model described by the continuum model, Young's moduli of the nanotube before and after the extraction of the inner shells were evaluated to be 0.77 and 0.80TPa, respectively. This good agreement between the two values indicates that the classical continuum model is effective for describing the mechanical behaviors of multiwall nanotubes.

引用

收藏

页码：L1097 / L1099

页数：3

相关论文

共 17 条

[1] Nanotweezers consisting of carbon nanotubes operating in an atomic force microscope [J].

Akita, S ;

Nakayama, Y ;

Mizooka, S ;

Takano, Y ;

Okawa, T ;

Miyatake, Y ;

Yamanaka, S ;

Tsuji, M ;

Nosaka, T .

APPLIED PHYSICS LETTERS, 2001, 79 (11) :1691-1693

[2] Carbon nanotube tips for a scanning probe microscope: their fabrication and properties [J].

Akita, S ;

Nishijima, H ;

Nakayama, Y ;

Tokumasu, F ;

Takeyasu, K .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1999, 32 (09) :1044-1048

[3] Extraction of inner shell from multiwall carbon nanotubes for scanning probe microscope tip [J].

Akita, S ;

Nakayama, Y .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2003, 42 (6B) :3933-3936

[4] Influence of force acting on side face of carbon nanotube in atomic force microscopy [J].

Akita, S ;

Nishijima, H ;

Kishida, T ;

Nakayama, Y .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2000, 39 (6B) :3724-3727

[5] Engineering carbon nanotubes and nanotube circuits using electrical breakdown [J].

Collins, PC ;

Arnold, MS ;

Avouris, P .

SCIENCE, 2001, 292 (5517) :706-709

[6] Nanotubes as nanoprobes in scanning probe microscopy [J].

Dai, HJ ;

Hafner, JH ;

Rinzler, AG ;

Colbert, DT ;

Smalley, RE .

NATURE, 1996, 384 (6605) :147-150

[7] Thermal transport measurements of individual multiwalled nanotubes [J].

Kim, P ;

Shi, L ;

Majumdar, A ;

McEuen, PL .

PHYSICAL REVIEW LETTERS, 2001, 87 (21) :215502-1

[8] Nanotube nanotweezers [J].

Kim, P ;

Lieber, CM .

SCIENCE, 1999, 286 (5447) :2148-2150

[9] Carbon-nanotube tips for scanning probe microscopy: Preparation by a controlled process and observation of deoxyribonucleic acid [J].

Nishijima, H ;

Kamo, S ;

Akita, S ;

Nakayama, Y ;

Hohmura, KI ;

Yoshimura, SH ;

Takeyasu, K .

APPLIED PHYSICS LETTERS, 1999, 74 (26) :4061-4063

[10] Carbon nanotube oscillators toward zeptogram detection [J].

Nishio, M ;

Sawaya, S ;

Akita, S ;

Nakayama, Y .

APPLIED PHYSICS LETTERS, 2005, 86 (13) :1-3