Aperture scanning near-field optical microscopy and spectroscopy of single terrylene molecules at 1.8 K

被引:4
作者
Butter, JYP [1 ]
Hecht, B [1 ]
机构
[1] Univ Basel, Nanopt Grp, Natl Ctr Competence Res Nanoscale Sci, Inst Phys, CH-4056 Basel, Switzerland
关键词
D O I
10.1088/0957-4484/17/6/002
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Single-molecule imaging and spectroscopy using an aperture scanning near-field optical microscope operating at 1.8 K in a helium bath cryostat is demonstrated. From near-field images at constant excitation frequency, the orientation of single molecules can be deduced. Spectral information is obtained using both near-field and confocal excitation schemes by scanning the excitation frequency at a fixed sample position. Differences between near-field and confocal spectra are discussed in terms of the position with respect to the aperture and the molecular orientation.
引用
收藏
页码:1547 / 1550
页数:4
相关论文
共 23 条
[1]  
Abbe E., 1873, Archiv f)r mikroskopische Anatomie, V9, P413, DOI DOI 10.1007/BF02956173
[2]  
Basche T., 1997, SINGLE MOL OPTICAL D
[3]   SINGLE MOLECULES OBSERVED BY NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
BETZIG, E ;
CHICHESTER, RJ .
SCIENCE, 1993, 262 (5138) :1422-1425
[4]   Molecular mechanisms of photo-induced spectral diffusion of single terrylene molecules in p terphenyl [J].
Bordat, P ;
Brown, R .
JOURNAL OF CHEMICAL PHYSICS, 2002, 116 (01) :229-236
[5]   Low-temperature near-field spectroscopy of CdTe quantum dots [J].
Brun, M ;
Huant, S ;
Woehl, JC ;
Motte, JF ;
Marshal, L ;
Mariette, H .
JOURNAL OF MICROSCOPY-OXFORD, 2001, 202 :202-208
[6]   Near-field scanning optical microscopy [J].
Dunn, RC .
CHEMICAL REVIEWS, 1999, 99 (10) :2891-+
[7]   Exciton relaxation and level repulsion in GaAs/AlxGa1-xAs quantum wires [J].
Feltrin, A ;
Idrissi Kaitouni, R ;
Crottini, A ;
Dupertuis, MA ;
Staehli, JL ;
Deveaud, B ;
Savona, V ;
Wang, XL ;
Ogura, M .
PHYSICAL REVIEW B, 2004, 69 (20) :205321-1
[8]   OPTICAL SPECTROSCOPY OF A GAAS/ALGAAS QUANTUM-WIRE STRUCTURE USING NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
GROBER, RD ;
HARRIS, TD ;
TRAUTMAN, JK ;
BETZIG, E ;
WEGSCHEIDER, W ;
PFEIFFER, L ;
WEST, K .
APPLIED PHYSICS LETTERS, 1994, 64 (11) :1421-1423
[9]   High spatial resolution spectroscopy of single semiconductor nanostructures [J].
Harris, TD ;
Gershoni, D ;
Pfeiffer, L ;
Nirmal, M ;
Trautman, JK ;
Macklin, JJ .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1996, 11 (11) :1569-1574
[10]   Scanning near-field optical microscopy with aperture probes: Fundamentals and applications [J].
Hecht, B ;
Sick, B ;
Wild, UP ;
Deckert, V ;
Zenobi, R ;
Martin, OJF ;
Pohl, DW .
JOURNAL OF CHEMICAL PHYSICS, 2000, 112 (18) :7761-7774