XPS and SSIMS studies of Pd/SnOx system:: reduction and oxidation in'hydrogen containing air

被引：37

作者：

Moroseac, M ^{[1
]}

Skála, T ^{[1
]}

Veltruská, K ^{[1
]}

Matolín, V ^{[1
]}

Matolínová, I ^{[1
]}

机构：

[1] Charles Univ Prague, Fac Math & Phys, Dept Elect & Vacuum Phys, CR-18000 Prague 8, Czech Republic

来源：

SURFACE SCIENCE | 2004年 / 566卷 / 1-3 PART 2期

关键词：

palladium; tin oxides; metal-semiconductor interfaces; X-ray photoelectron spectroscopy; secondary ion mass spectroscopy;

D O I：

10.1016/j.susc.2004.06.068

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

In this work the study of a redox process on Pd/SnOx system by means of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS) is presented. SnOx substrates were prepared by spray pyrolysis onto Si(1 1 1). Palladium ultra-thin films were evaporated in UHV chamber and then stabilised in air at 720 K for 2 h. Results obtained after thermal treatment in 1% H-2 containing air and in pure air showed the reversible change in palladium chemical state. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：1118 / 1123

页数：6