Characterization of 50-mm-diameter Y123 films prepared by a coating-pyrolysis process using an infrared image furnace

被引:12
作者
Kumagai, T
Manabe, T
Kondo, W
Murayama, K
Hashimoto, T
Kobayashi, Y
Yamaguchi, I
Sohma, M
Tsuchiya, T
Tsukada, K
Mizuta, S
机构
[1] Natl Inst Adv Ind Sci & Technol, AIST, Tsukuba, Ibaraki 3058565, Japan
[2] Daikin Environm Lab Ltd, Tsukuba, Ibaraki 3050841, Japan
[3] Saitama Univ, Urawa, Saitama 3388570, Japan
来源
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2002年 / 378卷
关键词
infrared image furnace; critical current density; surface resistance;
D O I
10.1016/S0921-4534(02)01739-2
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial YBa2Cu3O7-y (Y123) films were prepared on 50-mm-diameter LaAlO3 (LAO)(0 0 1), NdGaO3 (NGO) (1 1 0) and CeO2-buffered AI(2)O(3)(0 1 2) substrates by a chemical solution-based coating-pyrolysis process using a large-area infrared image furnace for high-temperature heat treatment. The furnace provides uniform temperature distribution over the film specimens and high irradiation power density that enables a high heating rate (similar to200 degreesC/min). An average inductive-J(c) (77 K) in excess of 2 MA/cm(2) was reproducibly obtained for 0.3-0.7-mum-thick c-axis-oriented Y123 films on LAO(0 0 1), of which the variation was fairly small all over the films. Microwave surface resistance of the film was 0.48 mOmega at 12 GHz and 70 K by the sapphire rod resonator method. Moreover, an average J(c) (77 K) = 0.5 MA/ cm(2) and T-c = 89 K were attained in a 0.3-mum-thick film on CeO2-buffered Al2O3(0 1 2). Despite being subjected to rapid thermal annealing, the Y123 film on NGO(1 1 0) was a-axis oriented and resulted in lower J(c) (77 K) = 0.15 MA/cm(2) and T-c= 84 K. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1236 / 1240
页数:5
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