The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass

被引:38
作者
Loos, J
van Duren, JKJ
Morrissey, F
Janssen, RAJ
机构
[1] Eindhoven Univ Technol, Eindhoven Polymer Labs, NL-5600 MB Eindhoven, Netherlands
[2] Eindhoven Univ Technol, Dutch Polymer Inst, NL-5600 MB Eindhoven, Netherlands
[3] Eindhoven Univ Technol, Lab Macromol & Organ Chem, NL-5600 MB Eindhoven, Netherlands
[4] FEI Co, NL-5600 KA Eindhoven, Netherlands
关键词
focused ion beam; transmission electron microscopy; scanning electron microscope;
D O I
10.1016/S0032-3861(02)00643-2
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
The use of the focused ion beam (FIB) technique for cross-sectional transmission electron microscopy (TEM) specimen preparation of polymer solar cells deposited on glass substrates is described. Ultra-thin sections were prepared using the 'lift-out' technique. Electron microscopy investigations of these specimen resulted in detailed morphological information of the devices (e.g. thickness and interface roughness of the layers). In comparison with standard sample preparation routes for TEM investigations the used technique is well suited for precise sectioning of hybrid structures. (C) 2002 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:7493 / 7496
页数:4
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