Effect of Te precipitates on the performance of CdZnTe detectors

被引：139

作者：

Carini, GA ^{[1
]}

Bolotnikov, AE

Camarda, GS

Wright, GW

James, RB

Li, L

机构：

[1] Brookhaven Natl Lab, Dept Nonproliferat & Natl Secur, Upton, NY 11973 USA

[2] Yinnel Tech Inc, South Bend, IN 46619 USA

来源：

APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 14期

关键词：

D O I：

10.1063/1.2189912

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Measurements using the National Synchrotron Light Source provided a detailed comparisons of the microscale detector response and infrared microscopy images for CdZnTe Frisch-ring x-ray and gamma detectors. Analysis of the data showed conclusively that local deteriorations of the electron charge collection and x-ray device response fully correlate with the presence of Te precipitates as seen in the IR images. Effects of the surface processing conditions on the detector performance were also clearly observed. (c) 2006 American Institute of Physics.

引用

页数：3

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