Automatic Crystallographic Characterization in a Transmission Electron Microscope: Applications to Twinning Induced Plasticity Steels and Al Thin Films

被引：11

作者：

Galceran, M. ^{[1
,3
]}

Albou, A. ^{[2
]}

Renard, K. ^{[2
]}

Coulombier, M. ^{[2
]}

Jacques, P. J. ^{[2
]}

Godet, S. ^{[1
]}

机构：

[1] Univ Libre Brussels, Mat Engn Characterizat Synth & Recycling 4MAT, B-1050 Brussels, Belgium

[2] Catholic Univ Louvain, Inst Mech Mat & Civil Engn, IMAP, B-1348 Louvain, Belgium

[3] CIC Engn, Minano 01510, Alava, Spain

来源：

MICROSCOPY AND MICROANALYSIS | 2013年 / 19卷 / 03期

关键词：

twinning; thin films; transmission electron microscopy; electron diffraction; orientation mapping; BACKSCATTER DIFFRACTION; GRAIN; STRENGTH; ALUMINUM; TRANSFORMATION; ORIENTATION; MECHANISM; DUCTILITY; ALLOY; MODEL;

D O I：

10.1017/S1431927613000445

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A new automated crystallographic orientation mapping tool in a transmission electron microscope technique, which is based on pattern matching between every acquired electron diffraction pattern and precalculated templates, has been used for the microstructural characterization of nondeformed and deformed aluminum thin films and twinning-induced plasticity steels. The increased spatial resolution and the use of electron diffraction patterns rather than Kikuchi lines make this tool very appropriate to characterize fine grained and deformed microstructures.

引用

页码：693 / 697

页数：5

共 22 条

[1] Nanoscale characterization of the evolution of the twin-matrix orientation in Fe-Mn-C twinning-induced plasticity steel by means of transmission electron microscopy orientation mapping [J].

Albou, A. ;

Galceran, M. ;

Renard, K. ;

Godet, S. ;

Jacques, P. J. .

SCRIPTA MATERIALIA, 2013, 68 (06) :400-403

[2] A physical model of the twinning-induced plasticity effect in a high manganese austenitic steel [J].

Allain, S ;

Chateau, JP ;

Bouaziz, O .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2004, 387 :143-147

[3] Strain gradient plasticity analysis of the strength and ductility of thin metallic films using an enriched interface model [J].

Brugger, C. ;

Coulombier, M. ;

Massart, T. J. ;

Raskin, J. -P. ;

Pardoen, T. .

ACTA MATERIALIA, 2010, 58 (15) :4940-4949

[4] Imperfection-sensitive ductility of aluminium thin films [J].

Coulombier, M. ;

Boe, A. ;

Brugger, C. ;

Raskin, J. P. ;

Pardoen, T. .

SCRIPTA MATERIALIA, 2010, 62 (10) :742-745

[5] Quantitative analysis of grain subdivision in cold rolled aluminium [J].

Delannay, L ;

Mishin, OV ;

Jensen, DJ ;

Van Houtte, P .

ACTA MATERIALIA, 2001, 49 (13) :2441-2451

[6] THE THERMOMECHANICAL INTEGRITY OF THIN-FILMS AND MULTILAYERS [J].

EVANS, AG ;

HUTCHINSON, JW .

ACTA METALLURGICA ET MATERIALIA, 1995, 43 (07) :2507-2530

[7] Grain-scale characterization of transformation textures [J].

Godet, S ;

Glez, JC ;

He, Y ;

Jonas, JJ ;

Jacques, PJ .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2004, 37 :417-425

[8] Application of electron backscatter diffraction to the study of phase transformations: present and possible future [J].

Gourgues-Lorenzon, A. -F. .

JOURNAL OF MICROSCOPY, 2009, 233 (03) :460-473

[9] High strength Fe-Mn-(Al, Si) TRIP/TWIP steels development -: properties -: application [J].

Grässel, O ;

Krüger, L ;

Frommeyer, G ;

Meyer, LW .

INTERNATIONAL JOURNAL OF PLASTICITY, 2000, 16 (10-11) :1391-1409

[10] New On-Chip Nanomechanical Testing Laboratory - Applications to Aluminum and Polysilicon Thin Films [J].

Gravier, Sebastien ;

Coulombier, Michael ;

Safi, Asmahan ;

Andre, Nicolas ;

Boe, Alexandre ;

Raskin, Jean-Pierre ;

Pardoen, Thomas .

JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2009, 18 (03) :555-569

← 1 2 3 →