Silicon surface morphologies after femtosecond laser irradiation

被引:157
作者
Tull, Brian R.
Carey, James E.
Mazur, Eric
McDonald, Joel P.
Yalisove, Steven M.
机构
关键词
laser ablation; morphology; oxide; Si;
D O I
10.1557/mrs2006.160
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this article, we present summaries of the evolution of surface morphology resulting from the irradiation of single-crystal silicon with femtosecond laser pulses. In the first section, we discuss the development of micrometer-sized cones on a silicon surface irradiated with hundreds of femtosecond laser pulses in the presence of sulfur hexafluoride and other gases. We propose a general formation mechanism for the surface spikes. In the second section, we discuss the formation of blisters or bubbles at the interface between a thermal silicon oxide and a silicon surface after irradiation with one or more femtosecond laser pulses. We discuss the physical mechanism for blister formation and its potential use as channels in microfluidic devices.
引用
收藏
页码:626 / 633
页数:8
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