Characterisation of PZT thin film micro-actuators using a silicon micro-force sensor

被引:22
作者
Duval, Fabrice F. C.
Wilson, Stephen A.
Ensell, Graham
Evanno, Nicolas M. P.
Cain, Markys G.
Whatmore, Roger W.
机构
[1] Cranfield Univ, Sch Ind & Mfg Sci, Cranfield MK43 0AL, Beds, England
[2] INNOS Ltd, Southampton SO17 1BJ, Hants, England
[3] Rolls Royce PLC, Strateg Res Ctr, Derby DE24 8BJ, England
[4] Natl Phys Lab, Teddington TW11 0LW, Middx, England
基金
英国工程与自然科学研究理事会;
关键词
PZT; cantilevers; vibrometry; force sensors; blocking force;
D O I
10.1016/j.sna.2006.03.035
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reports on the measurements of displacement and blocking force of piezoelectric micro-cantilevers. The free displacement was studied using a surface profiler and a laser vibrometer. The experimental data were compared with an analytical model which showed that the PZT thin film has a Young's modulus of 110 GPa and a piezoelectric coefficient d(31,f) of 30 pC/N. The blocking force was investigated by means of a micro-machined silicon force sensor based on the silicon piezoresistive effect. The generated force was detected by measuring a change in voltage within a piezoresistors bridge. The sensor was calibrated using a commercial nano-indenter as a force and displacement standard. Application of the method showed that a 700 mu m long micro-cantilever showed a maximum displacement of 800 nm and a blocking force of 0.1 mN at an actuation voltage of 5 V, within experimental error of the theoretical predictions based on the known piezoelectric and elastic properties of the PZT film. (c) 2006 Elsevier B.V All rights reserved.
引用
收藏
页码:35 / 44
页数:10
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