Design, tolerance analysis, and fabrication of silicon oxynitride based planar optical waveguides for communication devices

被引:123
作者
Wörhoff, K [1 ]
Lambek, PV [1 ]
Driessen, A [1 ]
机构
[1] Univ Twente, MESA Res Inst, Lightwave Devices Grp, NL-7500 AE Enschede, Netherlands
关键词
chemical vapor deposition; optical planar waveguides; polarization independence; silicon oxynitride (SiON); telecommunication;
D O I
10.1109/50.779161
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Planar optical waveguiding structures fbr application in communication networks are highly demanding with respect to low insertion loss, efficient fiber-to-chip coupling, polarization independent operation, high integration density, reliable fabrication, and last but not least cost efficiency. When applying silicon oxynitride, which is a very versatile material, planar waveguiding structures can be designed having the potential of meeting all those requirements. In this paper, we will describe the design of such a waveguiding structure, demonstrate the practical feasibility of realizing this structure and discuss the preliminary measurement results.
引用
收藏
页码:1401 / 1407
页数:7
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