Directly patterning metal films by nanoimprint lithography with low-temperature and low-pressure

被引:60
作者
Chen, HL
Chuang, SY
Cheng, HC
Lin, CH
Chu, TC
机构
[1] Natl Nano Device Lab, Hsinchu, Taiwan
[2] Yuanpei Inst Sci & Technol, Hsinchu, Taiwan
关键词
nanoimprint lithography; mold; metal/polymer bi-layer structure; optical grating;
D O I
10.1016/j.mee.2006.01.095
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrated a new imprint method named nanoimprinting in metal/polymer bi-layer structures (NIMB) for patterning metal films with varied profiles. Converse with conventional nanoimprint lithography, the patterned mold is directly imprint in metal films not in polymer based resists. In general, direct imprint in metal films need ultra-high pressure or temperature to form patterns. In this paper, we improve the direct imprint processes by using a sharp mold and an underlying soft pad layer for the reduction of the imprint pressure and temperature. The imprint pressure can be reduced to be compatible with the conventional nanoimprint instrument. For the direct contact the metal film with mold, no surfactant should be coated on the surface of mold. It also indicates no mold-rework-processes are necessary for this direct imprint method. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:893 / 896
页数:4
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