WSXM:: A software for scanning probe microscopy and a tool for nanotechnology

被引：6961

作者：

Horcas, I.

Fernandez, R.

Gomez-Rodriguez, J. M.

Colchero, J.

Gomez-Herrero, J.

Baro, A. M.

机构：

[1] Nanotec Elect SL, Ctr Empresaial Euronova, E-28049 Madrid, Spain

[2] Univ Autonoma Madrid, Dept Fis Mat Condensada, Lab Nuevas Microscopias, E-28049 Madrid, Spain

[3] Univ Murcia, Fac Quim, Dept Fis, E-30100 Murcia, Spain

[4] Univ Autonoma Madrid, Dept Fis Mat Condensada, Dept Fis, E-28049 Madrid, Spain

[5] Univ Autonoma Madrid, Dept Fis Mat Condensada, Lab Neuvas Microscopias, E-28049 Madrid, Spain

[6] CSIC, Inst Ciencias Mat, E-28049 Madrid, Spain

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2007年 / 78卷 / 01期

关键词：

D O I：

10.1063/1.2432410

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out. (c) 2007 American Institute of Physics.

引用

页数：8

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