Preparation and piezoelectricity of c-axis oriented LiNbO3 thin films on polycrystalline Si3N4 substrates

被引:10
作者
Usui, I
Tamai, F
Towata, Y
Yamada, T
机构
[1] Industrial Technology Cent of Saga, Saga
关键词
LiNbO3; thin films; polycrystalline substrates; sputtering; analysis of variance; orientation; SAW; IDT;
D O I
10.2109/jcersj.105.97
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
C-axis orientation of LiNbO3 thin films prepared on polycrystalline Si3N4 substrates by RF magnetron sputtering was optimized by analysis pf the variance. The LiNbO3 thin film was completely oriented in the c-axis direction. Using an interdigital transducer fabricated on the him, a resonance was observed at a frequency of 800 MHz, which showed that the film exhibited piezoelectric properties. It was proved that a c-axis-oriented LiNbO3 thin film can be used to detect mechanical impact.
引用
收藏
页码:97 / 100
页数:4
相关论文
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