Hydration of passive oxide films on aluminum

被引：201

作者：

Bunker, BC

Nelson, GC

Zavadil, KR

Barbour, JC

Wall, FD

Sullivan, JP

Windisch, CF

Engelhardt, MH

Baer, DR

机构：

[1] Sandia Natl Labs, Albuquerque, NM 87185 USA

[2] Pacific NW Natl Lab, Richland, WA 99352 USA

来源：

JOURNAL OF PHYSICAL CHEMISTRY B | 2002年 / 106卷 / 18期

关键词：

D O I：

10.1021/jp013246e

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Secondary ion mass spectrometry (SIMS) has been used in conjunction with isotopic labeling to determine the extent and rate of passive film hydration on aluminum. The rates at which oxygen- and hydrogen-containing species migrate through the film have been determined as a function of temperature and applied potential (cathodic and anodic polarization). The results suggest that defects such as hydroxide ions are prevalent and mobile in the oxide film, influencinc, the kinetics and mechanisms of corrosion and pitting processes.

引用

页码：4705 / 4713

页数：9

共 25 条

[1]

ALWITT RS, 1976, OXIDES OXIDE FILMS, pCH3

[2] PROTON MOBILITY IN SOLIDS .2. DIELECTRIC AND DIFFUSION MEASUREMENTS IN BOEHMITE [J].