Impact of microstructure on stability of permanent magnet biased magnetoresistive heads

被引:20
作者
Zhu, JG
OConnor, DJ
机构
[1] UNIV MINNESOTA, MINT, DEPT ELECT ENGN, MINNEAPOLIS, MN 55455 USA
[2] SEAGATE TECHNOL, MINNEAPOLIS, MN 55455 USA
关键词
D O I
10.1109/20.477550
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work pertains to output voltage stability of soft adjacent layer biased magnetoresistive heads with abutted permanent magnetic films for domain stabilization. A micromagnetic model has been developed to study the effect of the permanent magnet film microstructure and the micromagnetic properties of the abutted junction interface on head stability. The impact on head stability is analyzed with respect to interfacial ferromagnetic coupling across the junction interface and intergranular exchange coupling in the permanent magnet films among other film properties.
引用
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页码:54 / 60
页数:7
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