Magnetic resonance force detection and spectroscopy of electron spins in phosphorus-doped silicon

被引：37

作者：

Wago, K ^{[1
]}

Zuger, O ^{[1
]}

Wegener, J ^{[1
]}

Kendrick, R ^{[1
]}

Yannoni, CS ^{[1
]}

Rugar, D ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1997年 / 68卷 / 04期

关键词：

D O I：

10.1063/1.1147967

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Electron spin resonance (ESR) of phosphorus-doped silicon was detected using a low temperature magnetic resonance force microscope (MRFM). Force-detected ESR spectra were obtained using an amplitude or frequency modulated microwave field to cyclically saturate the spin magnetization. For a sample containing 4 X 10(18) phosphorus atoms/cm(3), a single strong ESR line was observed. For a sample containing 8 X 10(16) phosphorus atoms/cm(3), a pair of lines split by the 42 G P-31 hyperfine interaction was observed. This result demonstrates the possibility of using MRFM techniques for spectroscopic purposes. (C) 1997 American Institute of Physics.

引用

页码：1823 / 1826

页数：4

共 26 条

[1] ANHARMONIC MODULATION FOR NOISE-REDUCTION IN MAGNETIC-RESONANCE FORCE MICROSCOPY [J].