Nondestructive assessment of thinning of plates using digital shearography

被引：25

作者：

Sirohi, RS ^{[1
]}

Tay, CJ ^{[1
]}

Shang, HM ^{[1
]}

Boo, WP ^{[1
]}

机构：

[1] Natl Univ Singapore, Singapore 119260, Singapore

来源：

OPTICAL ENGINEERING | 1999年 / 38卷 / 09期

关键词：

digital shearography; defect detection; nondestructive testing; speckle metrology; interferometry;

D O I：

10.1117/1.602210

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A novel method of estimating the remaining thickness of a defective plate having the form of localized thinning using digital shearography, based on a simple relationship between the curvature of the deflected defect and the defect geometry is presented. (C) 1999 society of Photo Optical Instrumentation Engineers. [S0091-3286(99)01709-2].

引用

页码：1582 / 1585

页数：4

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