COMPUTER-AIDED ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI) - DEFORMATION ANALYSIS BY FRINGE MANIPULATION

被引：13

作者：

OWNERPETERSEN, M ^{[1
]}

JENSEN, PD ^{[1
]}

机构：

[1] DME AS, DK-2730 HERLEV, DENMARK

来源：

NDT INTERNATIONAL | 1988年 / 21卷 / 06期

关键词：

D O I：

10.1016/0308-9126(88)90286-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：422 / 426

页数：5

共 12 条

[1]

[Anonymous], 1983, HOLOGRAPHIC SPECKLE

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APPLIED OPTICS, 1985, 24 (14) :2145-2149

[3]

Butters J. N., 1971, Optics and Laser Technology, V3, P26, DOI 10.1016/S0030-3992(71)80007-5

[4]

Creath K., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V556, P337, DOI 10.1117/12.949561

[5] FRINGE INTERPOLATION BY 2-REFERENCE-BEAM HOLOGRAPHIC-INTERFEROMETRY - REDUCING SENSITIVITY TO HOLOGRAM MISALIGNMENT [J].

DANDLIKER, R ;

THALMANN, R ;

WILLEMIN, JF .

OPTICS COMMUNICATIONS, 1982, 42 (05) :301-306

[6] A DIGITAL PHASE-MEASUREMENT SYSTEM FOR REAL-TIME HOLOGRAPHIC-INTERFEROMETRY [J].

HARIHARAN, P ;

OREB, BF ;

BROWN, N .

OPTICS COMMUNICATIONS, 1982, 41 (06) :393-396

[7] QUASI-HETERODYNE HOLOGRAM INTERFEROMETRY [J].

HARIHARAN, P .

OPTICAL ENGINEERING, 1985, 24 (04) :632-638

[8]

LOKBERG OJ, 1979, P SOC PHOTO-OPT INS, V215, P313

[9] FRINGE SCANNING SPECKLE-PATTERN INTERFEROMETRY [J].

NAKADATE, S ;

SAITO, H .

APPLIED OPTICS, 1985, 24 (14) :2172-2180

[10] DIGITAL PHASE STEPPING SPECKLE INTERFEROMETRY [J].

ROBINSON, DW ;

WILLIAMS, DC .

OPTICS COMMUNICATIONS, 1986, 57 (01) :26-30

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