QUASI-HETERODYNE HOLOGRAM INTERFEROMETRY

[1] ALEKSANDROV EB, 1967, SOV PHYS TECH PHYS-U, V12, P258

[2] DIGITAL WAVEFRONT MEASURING INTERFEROMETER FOR TESTING OPTICAL SURFACES AND LENSES [J]. APPLIED OPTICS, 1974, 13 (11) : 2693 - 2703

[3] CarreP, 1966, METROLOGIA, V2, P13, DOI DOI 10.1088/0026-1394/2/1/005

[4] FRINGE INTERPOLATION BY 2-REFERENCE-BEAM HOLOGRAPHIC-INTERFEROMETRY - REDUCING SENSITIVITY TO HOLOGRAM MISALIGNMENT [J]. OPTICS COMMUNICATIONS, 1982, 42 (05) : 301 - 306

[5] Dandliker R., 1980, PROGR OPTICS, V17, P1

[6] DANDLIKER R, 1973, OPT COMMUN, V9, P413

[7] DORBAND B, 1982, OPTIK, V60, P161

[8] MEASUREMENT OF IN-PLANE SURFACE STRAIN BY HOLOGRAM INTERFEROMETRY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (07): : 731 - &

[9] OPTICAL-PHASE MEASUREMENT IN REAL-TIME [J]. APPLIED OPTICS, 1979, 18 (19): : 3301 - 3306

[10] HOLOGRAPHIC INTERFEROMETER FOR MEASUREMENT OF VECTOR DISPLACEMENT OF A SLOWLY DEFORMING ROUGH SURFACE [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 : 253 - 258

[1] ALEKSANDROV EB, 1967, SOV PHYS TECH PHYS-U, V12, P258

[2] DIGITAL WAVEFRONT MEASURING INTERFEROMETER FOR TESTING OPTICAL SURFACES AND LENSES [J]. APPLIED OPTICS, 1974, 13 (11) : 2693 - 2703

[3] CarreP, 1966, METROLOGIA, V2, P13, DOI DOI 10.1088/0026-1394/2/1/005

[4] FRINGE INTERPOLATION BY 2-REFERENCE-BEAM HOLOGRAPHIC-INTERFEROMETRY - REDUCING SENSITIVITY TO HOLOGRAM MISALIGNMENT [J]. OPTICS COMMUNICATIONS, 1982, 42 (05) : 301 - 306

[5] Dandliker R., 1980, PROGR OPTICS, V17, P1

[6] DANDLIKER R, 1973, OPT COMMUN, V9, P413

[7] DORBAND B, 1982, OPTIK, V60, P161

[8] MEASUREMENT OF IN-PLANE SURFACE STRAIN BY HOLOGRAM INTERFEROMETRY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (07): : 731 - &

[9] OPTICAL-PHASE MEASUREMENT IN REAL-TIME [J]. APPLIED OPTICS, 1979, 18 (19): : 3301 - 3306

[10] HOLOGRAPHIC INTERFEROMETER FOR MEASUREMENT OF VECTOR DISPLACEMENT OF A SLOWLY DEFORMING ROUGH SURFACE [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 : 253 - 258