Quantification of the Information Limit of Transmission Electron Microscopes

被引：47

作者：

Barthel, J. ^{[1
]}

Thust, A. ^{[1
]}

机构：

[1] Forschungszentrum Julich, Inst Solid State Res, D-52425 Julich, Germany

来源：

PHYSICAL REVIEW LETTERS | 2008年 / 101卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.101.200801

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The resolving power of high-resolution transmission electron microscopes is characterized by the information limit, which reflects the size of the smallest object detail observable with a particular instrument. We introduce a highly accurate measurement method for the information limit, which is suitable for modern aberration-corrected electron microscopes. An experimental comparison with the traditionally applied Young's fringe method yields severe discrepancies and confirms theoretical considerations according to which the Young's fringe method does not reveal the information limit.

引用

页数：4

共 11 条

[1]

FRANK J, 1973, OPTIK, V38, P519

[2]

FRANK J, 1976, OPTIK, V44, P379

[3]

HANSSEN KJ, 1971, OPTIK, V32, P519

[4]

HAWKES PW, 1980, OPTIK, V55, P207

[5] SINGLE SIDE-BAND IMAGING IN HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].

HOHENSTEIN, M .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1992, 54 (06) :485-492

[6] CONTRAST TRANSFER OF CRYSTAL IMAGES IN TEM [J].

ISHIZUKA, K .

ULTRAMICROSCOPY, 1980, 5 (01) :55-65

[7]

KUJAWA S, 2006, MICROSC MICROANAL, V12, P1470

[8] RESOLUTION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].

OKEEFE, MA .

ULTRAMICROSCOPY, 1992, 47 (1-3) :282-297

[9] ZUR DEFOKUSSIERUNGSABHANGIGKEIT DES PHASENKONTRASTES BEI DER ELEKTRONENMIKROSKOPISCHEN ABBILDUNG [J].

THON, F .

ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1966, A 21 (04) :476-&

[10]

WADE RH, 1978, OPTIK, V50, P1

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