Phase unwrapping algorithm based on reliability and edge detection

被引：29

作者：

Li, JL

Su, XY

Li, JT

机构：

[1] Sichuan Union University, Opto-Electronics Department, Chengdu

[2] Zhejiang University, Sichuan Union University

[3] Optoelectronics Department, Sichuan Union University

来源：

OPTICAL ENGINEERING | 1997年 / 36卷 / 06期

关键词：

phase unwrapping; edge detection; intensity modulation; profilometry;

D O I：

10.1117/1.601194

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new phase unwrapping algorithm based on reliability and edge detection is presented. Since the edge is detected efficiently through edge relaxation, the unwrapping procedure is simplified within the areas embraced by edges. Penetrating edges according to reliability ensures that this method will limit the unwrapping error to local-minimum areas at worst. (C) 1997 Society of Photo-Optical instrumentation Engineers.

引用

页码：1685 / 1690

页数：6