Studies of full color field emission display core technologies with the electrical and structural analysis

被引：3

作者：

Kim, JM ^{[1
]}

Lee, HW ^{[1
]}

Choi, YS ^{[1
]}

Jung, JE ^{[1
]}

Lee, NS ^{[1
]}

Jin, YY ^{[1
]}

Park, NS ^{[1
]}

机构：

[1] Samsung Adv Inst Technol, Suwon, South Korea

来源：

APPLIED SURFACE SCIENCE | 1999年 / 146卷 / 1-4期

关键词：

FED; FEA; phosphor; aging;

D O I：

10.1016/S0169-4332(99)00045-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Electron beam spreading and its relationship with layout of field emission display (FED) is simulated and discussed. The morphological optimization of microtips is introduced for the effect of field enhancement with the process condition. The structural effect of thin film step coverage which is formed during the fabrication of field emitter arrays (FEAs) is uniquely studied with the reliability of FED. The surface condition of phosphor and its relationship with the brightness enhancement are analyzed and studied with the specific aging step. A unique approach of gas aging for the image stabilization is introduced and fully analyzed. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：209 / 216

页数：8

共 8 条

[1]

Hong JP, 1997, IVMC'97 - 1997 10TH INTERNATIONAL VACUUM MICROELECTRONICS CONFERENCE, TECHNICAL DIGEST, P692

[2] Parameters for improving reliability of full color field emission display devices [J].

Kim, JM ;

Hong, JP ;

Choi, JH ;

Ryu, YS ;

Hong, SS .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (02) :736-740

[3]

NEWMAN SJ, 1998, SID 98, P95

[4]

OKUDA M, 1998, SID 98, P185

[5] PHYSICAL-PROPERTIES OF THIN-FILM FIELD-EMISSION CATHODES WITH MOLYBDENUM CONES [J].

SPINDT, CA ;

BRODIE, I ;

HUMPHREY, L ;

WESTERBERG, ER .

JOURNAL OF APPLIED PHYSICS, 1976, 47 (12) :5248-5263

[6]

SPINDT CJ, 1998, SID 98, P99

[7]

UEMURA S, 1998, SID 98, V39, P1052

[8] Fabrication of thin-film cold cathodes by a modified chemical vapor deposition diamond process [J].

Weiss, BL ;

Badzian, A ;

Pilione, L ;

Badzian, T ;

Drawl, W .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (02) :681-683

← 1 →