Resolving nano scale recording bits on phase-change rewritable optical disk

被引：11

作者：

Lin, SK

Yang, PL

Lin, IC

Hsu, HW

Tsai, DP ^{[1
]}

机构：

[1] Natl Taiwan Univ, Ctr Nanostorage Res, Taipei 10617, Taiwan

[2] Natl Taiwan Univ, Dept Phys, Taipei 10617, Taiwan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2006年 / 45卷 / 2B期

关键词：

conductive-atomic force microscopy (C-AFM); rewritable optical disk; digital versatile disk (DVD); phase-change material; recording bit; Blu-ray disk;

D O I：

10.1143/JJAP.45.1431

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We use a new imaging method to resolve the nano scale recording bits on phase-change rewritable optical disks. By this method, several kinds of nano scale recording bits on different phase-change optical disks can be clearly imaged without any painstaking or expensive procedures. With the conductive-atomic force microscopy (C-AFM) images of nano scale recording bits on phase-change materials, we can study the properties of phase-change recording layers and the recording bit formation mechanism comprehensively.

引用

页码：1431 / 1434

页数：4

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