Accurate evaluation of mu-PIXE and mu-XRF spectral data through iterative least squares fitting

被引：14

作者：

Janssens, K ^{[1
]}

Vekemans, B ^{[1
]}

Adams, F ^{[1
]}

vanEspen, P ^{[1
]}

Mutsaers, P ^{[1
]}

机构：

[1] EINDHOVEN UNIV TECHNOL,5600 MB EINDHOVEN,NETHERLANDS

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1996年 / 109卷

关键词：

D O I：

10.1016/0168-583X(95)01211-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The integration of the nonlinear least squares X-ray spectrum evaluation progam AXIL. into a mu-PIXE and a mu-XRF setup is discussed. The use of the software when procesing data sets derived from biological and geological samples is described.

引用

页码：179 / 185

页数：7

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