Critical thickness and orbital ordering in ultrathin La0.7Sr0.3MnO3 films

被引：383

作者：

Huijben, M. ^{[1
,2
,3
,4
,5
]}

Martin, L. W. ^{[1
,2
,3
]}

Chu, Y. -H. ^{[1
,2
,3
,6
]}

Holcomb, M. B. ^{[1
,2
,3
]}

Yu, P. ^{[1
,2
,3
]}

Rijnders, G. ^{[4
,5
]}

Blank, D. H. A. ^{[4
,5
]}

Ramesh, R. ^{[1
,2
,3
]}

机构：

[1] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

[4] Univ Twente, Fac Sci & Technol, NL-7500 AE Enschede, Netherlands

[5] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands

[6] Natl Chiao Tung Univ, Dept Mat Sci & Engn, Hsinchu 30010, Taiwan

来源：

PHYSICAL REVIEW B | 2008年 / 78卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.78.094413

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Detailed analysis of transport, magnetism, and x-ray absorption spectroscopy measurements on ultrathin La0.7Sr0.3MnO3 films with thicknesses from 3 to 70 unit cells resulted in the identification of a lower critical thickness for a nonmetallic nonferromagnetic layer at the interface with the SrTiO3 (001) substrate of only three unit cells (similar to 12 angstrom). Furthermore, linear-dichroism measurements demonstrate the presence of a preferred (x(2)-y(2)) in-plane orbital ordering for all layer thicknesses without any orbital reconstruction at the interface. A crucial requirement for the accurate study of these ultrathin films is a controlled growth process, offering the coexistence of layer-by-layer growth and bulklike magnetic/transport properties.

引用

页数：7

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