Critical thickness and orbital ordering in ultrathin La0.7Sr0.3MnO3 films

被引:383
作者
Huijben, M. [1 ,2 ,3 ,4 ,5 ]
Martin, L. W. [1 ,2 ,3 ]
Chu, Y. -H. [1 ,2 ,3 ,6 ]
Holcomb, M. B. [1 ,2 ,3 ]
Yu, P. [1 ,2 ,3 ]
Rijnders, G. [4 ,5 ]
Blank, D. H. A. [4 ,5 ]
Ramesh, R. [1 ,2 ,3 ]
机构
[1] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
[4] Univ Twente, Fac Sci & Technol, NL-7500 AE Enschede, Netherlands
[5] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands
[6] Natl Chiao Tung Univ, Dept Mat Sci & Engn, Hsinchu 30010, Taiwan
关键词
D O I
10.1103/PhysRevB.78.094413
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Detailed analysis of transport, magnetism, and x-ray absorption spectroscopy measurements on ultrathin La0.7Sr0.3MnO3 films with thicknesses from 3 to 70 unit cells resulted in the identification of a lower critical thickness for a nonmetallic nonferromagnetic layer at the interface with the SrTiO3 (001) substrate of only three unit cells (similar to 12 angstrom). Furthermore, linear-dichroism measurements demonstrate the presence of a preferred (x(2)-y(2)) in-plane orbital ordering for all layer thicknesses without any orbital reconstruction at the interface. A crucial requirement for the accurate study of these ultrathin films is a controlled growth process, offering the coexistence of layer-by-layer growth and bulklike magnetic/transport properties.
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页数:7
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