Structural basis for the conducting interface between LaAlO3 and SrTiO3

被引：425

作者：

Willmott, P. R. ^{[1
]}

Pauli, S. A.

Herger, R.

Schlepuetz, C. M.

Martoccia, D.

Patterson, B. D.

Delley, B.

Clarke, R.

Kumah, D.

Cionca, C.

Yacoby, Y.

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] Univ Michigan, Randall Lab Phys, Ann Arbor, MI 48109 USA

[3] Univ Michigan, FOCUS Ctr, Ann Arbor, MI 48109 USA

[4] Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

来源：

PHYSICAL REVIEW LETTERS | 2007年 / 99卷 / 15期

关键词：

D O I：

10.1103/PhysRevLett.99.155502

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The complete atomic structure of a five-monolayer film of LaAlO3 on SrTiO3 has been determined for the first time by surface x-ray diffraction in conjunction with the coherent Bragg rod analysis phase-retrieval method and further structural refinement. Cationic mixing at the interface results in dilatory distortions and the formation of metallic La1-xSrxTiO3. By invoking electrostatic potential minimization, the ratio of Ti4+/Ti3+ across the interface was determined, from which the lattice dilation could be quantitatively explained using ionic radii considerations. The correctness of this model is supported by density functional theory calculations. Thus, the formation of a quasi-two-dimensional electron gas in this system is explained, based on structural considerations.

引用

页数：4

共 25 条

[1] Electric field effect in correlated oxide systems [J].