Advanced surface analysis of silicate glasses, oxides and other insulating materials: A review

The present paper describes recent progress in characterization of the glass surface structure and minimization of the disturbance of the composition and structure during investigations employing sputtering. Considerations regarding the suitable choice of combinations of surface analysis methods, together with analytical electron microscopy for a description of the spatial distribution of the elements and the structure of surface layers are discussed. Methods for employing surface analysis to determine parameters which govern the kinetics of reactions between glasses and oxides is discussed. Developments in analysis methods and spectroscopy, which will form a basis for improved structural models of non-crystalline materials, thin layers and coatings, and for the simulation of chemical interaction of these materials with adjacent materials are also discussed.