In situ imaging of field emission from individual carbon nanotubes and their structural damage

被引:172
作者
Wang, ZL [1 ]
Gao, RP
de Heer, WA
Poncharal, P
机构
[1] Georgia Inst Technol, Sch Mat Sci & Engn, Ctr Nanosci & Nanotechnol, Atlanta, GA 30332 USA
[2] Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
关键词
D O I
10.1063/1.1446994
中图分类号
O59 [应用物理学];
学科分类号
摘要
Field emission of individual carbon nanotubes was observed by in situ transmission electron microscopy. A fluctuation in emission current was due to a variation in distance between the nanotube tip and the counter electrode owing to a "head-shaking" effect of the nanotube during field emission. Strong field-induced structural damage of a nanotube occurs in two ways: a piece-by-piece and segment-by-segment pilling process of the graphitic layers, and a concentrical layer-by-layer stripping process. The former is believed owing to a strong electrostatic force, and the latter is likely due to heating produced by emission current that flowed through the most outer graphitic layers. (C) 2002 American Institute of Physics.
引用
收藏
页码:856 / 858
页数:3
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