Diffraction by a surface with random terrace distribution: an analytical calculation

被引:15
作者
Croset, B [1 ]
deBeauvais, C [1 ]
机构
[1] UNIV PARIS 06,LAB MINERAL CRISTALLOG,F-75251 PARIS 05,FRANCE
关键词
atom-solid scattering and diffraction elastic; electron-solid diffraction; growth; surface structure; morphology; roughness and topography; X-ray scattering; diffraction and reflection;
D O I
10.1016/S0039-6028(97)00077-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We propose a new scheme in order to calculate analytically the diffracted intensity by a surface with random terrace distribution. We apply it to a two-level system and show that the average diffracted intensity depends simply on the characteristic function of the terrace's length distribution. We use this analytical result to connect the various details of the diffraction pattern - characteristics of the diffraction satellites and properties of the zone centre region - to the main features of the terrace distribution. (C) 1997 Elsevier Science B.V.
引用
收藏
页码:15 / 35
页数:21
相关论文
共 18 条
[1]   DIFFRACTION BY CRYSTALS WITH PLANAR DOMAINS [J].
ADLHART, W .
ACTA CRYSTALLOGRAPHICA SECTION A, 1981, 37 (NOV) :794-801
[3]  
CEVTKO D, 1994, SURF SCI, V307, P519
[4]  
ERNST HJ, 1992, PHYS REV B, V46, P19
[5]  
ETGENS VH, IN PRESS EUROPHYSICS
[6]  
GUINIER A, 1956, THEORIE TECHNIQUE RA, P417
[7]  
Guinier A., 1954, B SOC FRANC MINER CR, V77, P680
[8]   QUANTITATIVE-EVALUATION OF RANDOM DISTRIBUTED STEPS AT INTERFACES AND SURFACES [J].
HENZLER, M .
SURFACE SCIENCE, 1978, 73 (01) :240-251
[9]   DER IDEALE PARAKRISTALL UND DIE VON IHM GESTREUTE KOHARENTE RONTGENSTRAHLUNG [J].
HOSEMANN, R .
ZEITSCHRIFT FUR PHYSIK, 1950, 128 (04) :465-492