Measurements of temperature dependence of optical and thermal properties of optical disk materials

被引：41

作者：

Kuwahara, M

Suzuki, O

Taketoshi, N

Yamakawa, Y

Yagi, T

Fons, P

Tsutsumi, K

Suzuki, M

Fukaya, T

Tominaga, J

Baba, T

机构：

[1] AIST, Ctr Appl Near Field Opt Res, Tsukuba, Ibaraki 3058562, Japan

[2] AIST, Natl Metrol Inst Japan, Tsukuba, Ibaraki 3058563, Japan

[3] JA Woollam Japan Co, Suginami Ku, Tokyo 1670051, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2006年 / 45卷 / 2B期

关键词：

optical memory; super-resolution readout; refractive index; thermal conductivity; thermoreflectance; spectroscopic ellipsometory; temperature simulation; specific heat capacity; temperature dependence;

D O I：

10.1143/JJAP.45.1419

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have experimentally determined the temperature dependences of the refractive index and thermal conductivity for several optical disk materials from room temperature to 200-300 degrees C. A novel system for obtaining thermal conductivity in the films is also introduced. As a demonstration, temperature simulation inside a simple-structured disk with and without considerating the temperature dependence of the refractive index at a 405 nm wavelength was carried out, and the difference was approximately 15 degrees C at maximum temperature.

引用

页码：1419 / 1421

页数：3

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