Grain Boundary Complexions in Ceramics and Metals: An Overview

被引：67

作者：

Dillon, Shen J. ^{[1
]}

Harmer, Martin P. ^{[2
]}

Luo, Jian ^{[3
]}

机构：

[1] Univ Illinois, Urbana, IL 61801 USA

[2] Lehigh Univ, Bethlehem, PA USA

[3] Clemson Univ, Clemson, SC 29631 USA

来源：

JOM | 2009年 / 61卷 / 12期

基金：

美国国家科学基金会;

关键词：

SURFICIAL AMORPHOUS FILMS; THIN INTERGRANULAR FILMS; PHASE-TRANSITION; SILICON-CARBIDE; OXIDE; AL; SEGREGATION; INTERFACES; ALUMINA; GROWTH;

D O I：

10.1007/s11837-009-0179-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The concepts of grain boundary phase transitions and complexions offer clues to resolve old problems such as abnormal grain growth and solid-state activated sintering as well as new opportunities for mechanism-informed materials design.

引用

页码：38 / 44

页数：7

共 64 条

[1]

Ackler HD, 1999, J AM CERAM SOC, V82, P183, DOI 10.1111/j.1151-2916.1999.tb01739.x

[2] Premelting at defects within bulk colloidal crystals [J].

Alsayed, AM ;

Islam, MF ;

Zhang, J ;

Collings, PJ ;

Yodh, AG .

SCIENCE, 2005, 309 (5738) :1207-1210

[3] Intergranular films at metal-ceramic interfaces Part I - interface structure and chemistry [J].

Avishai, A ;

Scheu, C ;

Kaplan, WD .

ACTA MATERIALIA, 2005, 53 (05) :1559-1569

[4] Melting at dislocations and grain boundaries: A phase field crystal study [J].

Berry, Joel ;

Elder, K. R. ;

Grant, Martin .

PHYSICAL REVIEW B, 2008, 77 (22)

[5] Continuum modelling and representations of interfaces and their transitions in materials [J].

Bishop, Catherine M. ;

Tang, Ming ;

Cannon, Rowland M. ;

Carter, W. Craig .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2006, 422 (1-2) :102-114

[6]

Cahn J.W., 1982, J PHYS-PARIS, V43, pC6

[7]

Cannon RM, 2000, CERAM TRANS, V118, P427

[8]

Cannon RM, 1999, Z METALLKD, V90, P1002

[9] RE-EXAMINATION OF EXPERIMENTAL STRENGTH-VS-GRAIN-SIZE DATA FOR CERAMICS [J].

CARNIGLIA, SC .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1972, 55 (05) :243-+

[10] HREM and STEM of intergranular films at zinc oxide varistor grain boundaries [J].

Chiang, YM ;

Wang, H ;

Lee, JR .

JOURNAL OF MICROSCOPY-OXFORD, 1998, 191 :275-285

← 1 2 3 4 5 6 7 →