Intergranular films at metal-ceramic interfaces Part I - interface structure and chemistry

被引：57

作者：

Avishai, A

Scheu, C

Kaplan, WD ^{[1
]}

机构：

[1] Technion Israel Inst Technol, Dept Engn Math, IL-32000 Haifa, Israel

[2] Max Planck Inst Metallforsch, D-70569 Stuttgart, Germany

来源：

ACTA MATERIALIA | 2005年 / 53卷 / 05期

基金：

以色列科学基金会;

关键词：

intergranular amorphous films; interface wetting; interface segregation; ceramic matrix composites; transmission electron microscopy;

D O I：

10.1016/j.actamat.2004.12.009

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this work the structure and chemistry of intergranular films at metal-ceramic interfaces was investigated via detailed microstructural characterization of model metal-Al2O3 nanocomposites. We report here experimental results indicating the formation and stability of equilibrium nanometer-thick films at metal-ceramic interfaces. Thin similar to1 nm interface films were observed for two different metal-alumina systems (Ni and Cu) doped with glass-forming additives. High spatial resolution energy dispersive spectroscopy showed a difference in the chemical composition of the films at Ni-alumina and Cu-alumina interfaces. These results may have immediate ramifications on structural and functional properties of metal-ceramic interfaces. (C) 2004 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：1559 / 1569

页数：11

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