High-excitation photoluminescence in GaN: Hot-carrier effects and the Mott transition

被引:107
作者
Binet, F
Duboz, JY
Off, J
Scholz, F
机构
[1] Thomson CSF, Cent Rech Lab, F-91404 Orsay, France
[2] Univ Stuttgart, Inst Phys 4, D-70550 Stuttgart, Germany
来源
PHYSICAL REVIEW B | 1999年 / 60卷 / 07期
关键词
D O I
10.1103/PhysRevB.60.4715
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Photoluminescence under intense excitation is studied in GaN. As the excitation density increases, we show the Mott transition between an excitonic recombination to a plasma-type recombination. The carrier density at the Mott transition is given. At and above the Mott density, we show that the carrier temperature is higher than the lattice temperature. The energy relaxation of the hot plasma is shown to be dominated by LO-phonon emission. Coulomb screening and band-gap renormalization are observed from the photoluminescence peak position and the measured renormalization factor is in good agreement with elementary many-body theory. Finally the dependence of the Mott density on carrier temperature is shown to follow a Debye-Huckel model. [S0163-1829(99)10727-6].
引用
收藏
页码:4715 / 4722
页数:8
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