Diffusion length of photoexcited carriers in GaN

被引:41
作者
Duboz, JY
Binet, F
Dolfi, D
Laurent, N
Scholz, F
Off, J
Sohmer, A
Briot, O
Gil, B
机构
[1] Thomson CSF, Cent Rech Lab, F-91404 Orsay, France
[2] Univ Stuttgart, Inst Phys, D-70550 Stuttgart, Germany
[3] Univ Montpellier 2, Etud Semicond Grp, CNRS, F-34095 Montpellier, France
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1997年 / 50卷 / 1-3期
关键词
diffusion length; photoexcited carriers; GaN;
D O I
10.1016/S0921-5107(97)00192-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
When additional carriers are introduced in a material with a non uniform concentration, they tend to diffuse on a scale given by their diffusion length. This parameter can be measured by different methods. Depending on the conditions, different values can be found as the recombination mechanisms differ. In this paper, we present the situation in GaN with various experiments including the photocarrier grating method, photoluminescence and the spectral response in photoconductors. We show that the diffusion length varies from 0.1 mu m to a few mu m depending on experimental conditions. The interpretation is given based on the diffusion equations and on the analysis of the recombinations. (C) 1997 Elsevier Science S.A.
引用
收藏
页码:289 / 295
页数:7
相关论文
共 12 条
[1]   THE THEORY OF THE PHOTOCONDUCTANCE UNDER THE PRESENCE OF A SMALL PHOTOCARRIER GRATING [J].
BALBERG, I .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (10) :6329-6333
[2]   Properties of a photovoltaic detector based on an n-type GaN Schottky barrier [J].
Binet, F ;
Duboz, JY ;
Laurent, N ;
Rosencher, E ;
Briot, O ;
Aulombard, RL .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (09) :6449-6454
[3]   Mechanisms of recombination in GaN photodetectors [J].
Binet, F ;
Duboz, JY ;
Rosencher, E ;
Scholz, F ;
Harle, V .
APPLIED PHYSICS LETTERS, 1996, 69 (09) :1202-1204
[4]   Electron beam induced current measurements of minority carrier diffusion length in gallium nitride [J].
Chernyak, L ;
Osinsky, A ;
Temkin, H ;
Yang, JW ;
Chen, Q ;
Khan, MA .
APPLIED PHYSICS LETTERS, 1996, 69 (17) :2531-2533
[5]   Room temperature pulsed operation of nitride based multi-quantum-well laser diodes with cleaved facets on conventional C-face sapphire substrates [J].
Itaya, K ;
Onomura, M ;
Nishio, J ;
Sugiura, L ;
Saito, S ;
Suzuki, M ;
Rennie, J ;
Nunoue, SY ;
Yamamoto, M ;
Fujimoto, H ;
Kokubun, Y ;
Ohba, Y ;
Hatakoshi, G ;
Ishikawa, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1996, 35 (10B) :L1315-L1317
[6]   HIGH-RESPONSIVITY PHOTOCONDUCTIVE ULTRAVIOLET SENSORS BASED ON INSULATING SINGLE-CRYSTAL GAN EPILAYERS [J].
KHAN, MA ;
KUZNIA, JN ;
OLSON, DT ;
VANHOVE, JM ;
BLASINGAME, M ;
REITZ, LF .
APPLIED PHYSICS LETTERS, 1992, 60 (23) :2917-2919
[7]   Blue-green light-emitting diodes and violet laser diodes [J].
Nakamura, S .
MRS BULLETIN, 1997, 22 (02) :29-35
[8]  
NAKAMURA S, 1996, JPN J APPL PHYS PT 1, V35, P74
[9]   STEADY-STATE PHOTOCARRIER GRATING TECHNIQUE FOR DIFFUSION LENGTH MEASUREMENT IN PHOTOCONDUCTIVE INSULATORS [J].
RITTER, D ;
ZELDOV, E ;
WEISER, K .
APPLIED PHYSICS LETTERS, 1986, 49 (13) :791-793
[10]   STEADY-STATE PHOTOCARRIER GRATING TECHNIQUE FOR DIFFUSION-LENGTH MEASUREMENT IN SEMICONDUCTORS - THEORY AND EXPERIMENTAL RESULTS FOR AMORPHOUS-SILICON AND SEMIINSULATING GAAS [J].
RITTER, D ;
WEISER, K ;
ZELDOV, E .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (11) :4563-4570